External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Distribution and generation of traps in SiO::2::/Al::2::O::3:: gate stacks

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt. Distribution and generation of traps in SiO::2::/Al::2::O::3:: gate stacks. Microelectronics Reliability, 47(4-5):525-527, 2007. [doi]

No reviews for this publication, yet.

runs on