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D. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic. NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectronics Reliability, 46(9-11):1828-1833, 2006. [doi]