D. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic. NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectronics Reliability, 46(9-11):1828-1833, 2006. [doi]
@article{DankovicMDDGS06,
title = {NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs},
author = {D. Dankovic and I. Manic and S. Djoric-Veljkovic and V. Davidovic and S. Golubovic and Ninoslav Stojadinovic},
year = {2006},
doi = {10.1016/j.microrel.2006.07.077},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.077},
researchr = {https://researchr.org/publication/DankovicMDDGS06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1828-1833},
}