Within-die gate delay variability measurement using re-configurable ring oscillator - researchr publication authors

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Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni, N. V. Arvind, V. Visvanathan. Within-die gate delay variability measurement using re-configurable ring oscillator. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 133-136, IEEE, 2008. [doi]

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