Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni, N. V. Arvind, V. Visvanathan. Within-die gate delay variability measurement using re-configurable ring oscillator. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 133-136, IEEE, 2008. [doi]
Abstract is missing.