Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni, N. V. Arvind, V. Visvanathan. Within-die gate delay variability measurement using re-configurable ring oscillator. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 133-136, IEEE, 2008. [doi]
@inproceedings{DasAJAV08,
title = {Within-die gate delay variability measurement using re-configurable ring oscillator},
author = {Bishnu Prasad Das and Bharadwaj Amrutur and H. S. Jamadagni and N. V. Arvind and V. Visvanathan},
year = {2008},
doi = {10.1109/CICC.2008.4672039},
url = {http://dx.doi.org/10.1109/CICC.2008.4672039},
researchr = {https://researchr.org/publication/DasAJAV08},
cites = {0},
citedby = {0},
pages = {133-136},
booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2018-6},
}