March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 256-261, IEEE Computer Society, 2006.

This author has not been identified. Look up 'Luigi Dilillo' in GoogleThis author has not been identified. Look up 'Patrick Girard' in GoogleThis author has not been identified. Look up 'Serge Pravossoudovitch' in GoogleThis author has not been identified. Look up 'Arnaud Virazel' in GoogleThis author has not been identified. Look up 'Magali Bastian' in Google

runs on WebDSL