The following publications are possibly variants of this publication:
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- Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test SolutionLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan. ats 2004: 266-271 [doi]
- Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address DecodersLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri. ats 2003: 250-255 [doi]
- Minimizing test power in SRAM through reduction of pre-charge activityLuigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard. date 2006: 1159-1164 [doi]
- Analysis of Resistive-Open Defects in SRAM Sense AmplifiersAlexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. tvlsi, 17(10):1556-1559, 2009. [doi]