Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing, 23(5):435-444, 2007. [doi]

Abstract

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