Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits - researchr publication related

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing, 23(5):435-444, 2007. [doi]

The following publications are possibly variants of this publication:

Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterizationLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. ets 2005: 116-121 [doi]

March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge CircuitLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. ddecs 2006: 256-261

Analysis of Resistive-Open Defects in SRAM Sense AmplifiersAlexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. tvlsi, 17(10):1556-1559, 2009. [doi]

Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test SolutionLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan. ats 2004: 266-271 [doi]

Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address DecodersLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri. ats 2003: 250-255 [doi]

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