A 1Mb 28nm STT-MRAM with 2.8ns read access time at 1.2V VDD using single-cap offset-cancelled sense amplifier and in-situ self-write-termination

Qing Dong, Zhehong Wang, Jongyup Lim, Yiqun Zhang 0002, Yi-Chun Shih, Yu-Der Chih, Jonathan Chang, David Blaauw, Dennis Sylvester. A 1Mb 28nm STT-MRAM with 2.8ns read access time at 1.2V VDD using single-cap offset-cancelled sense amplifier and in-situ self-write-termination. In 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018, San Francisco, CA, USA, February 11-15, 2018. pages 480-482, IEEE, 2018. [doi]

Authors

Qing Dong

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Zhehong Wang

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Jongyup Lim

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Yiqun Zhang 0002

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Yi-Chun Shih

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Yu-Der Chih

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Jonathan Chang

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David Blaauw

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Dennis Sylvester

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