Built in Defect Prognosis for Embedded Memories

Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani. Built in Defect Prognosis for Embedded Memories. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 167-172, IEEE Computer Society, 2007.

Abstract

Abstract is missing.