Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of GaN HEMTs

Steven J. Duffy, Brahim Benbakhti, Karol Kalna, Mohammed Boucherta, Wei-Dong Zhang, Nour E. Bourzgui, Ali Soltani. Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of GaN HEMTs. IEEE Access, 6:42721-42728, 2018. [doi]

Abstract

Abstract is missing.