Daniel Fainstein, Sami Rosenblatt, Alberto Cestero, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer. Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM. In Symposium on VLSI Circuits, VLSIC 2012, Honolulu, HI, USA, June 13-15, 2012. pages 146-147, IEEE, 2012. [doi]
@inproceedings{FainsteinRCRKI12,
title = {Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM},
author = {Daniel Fainstein and Sami Rosenblatt and Alberto Cestero and Norman Robson and Toshiaki Kirihata and Subramanian S. Iyer},
year = {2012},
doi = {10.1109/VLSIC.2012.6243832},
url = {http://dx.doi.org/10.1109/VLSIC.2012.6243832},
researchr = {https://researchr.org/publication/FainsteinRCRKI12},
cites = {0},
citedby = {0},
pages = {146-147},
booktitle = {Symposium on VLSI Circuits, VLSIC 2012, Honolulu, HI, USA, June 13-15, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0848-9},
}