Daniel Fainstein, Sami Rosenblatt, Alberto Cestero, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer. Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM. In Symposium on VLSI Circuits, VLSIC 2012, Honolulu, HI, USA, June 13-15, 2012. pages 146-147, IEEE, 2012. [doi]
Abstract is missing.