RT-Level Deviation-Based Grading of Functional Test Sequences - researchr publication authors

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Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti. RT-Level Deviation-Based Grading of Functional Test Sequences. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 264-269, IEEE Computer Society, 2009. [doi]

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