The following publications are possibly variants of this publication:
- Functional Test-Sequence Grading at Register-Transfer LevelHongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti. tvlsi, 20(10):1890-1894, 2012. [doi]
- RTL DFT Techniques to Enhance Defect Coverage for Functional Test SequencesHongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara. et, 26(2):151-164, 2010. [doi]
- RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverageAlodeep Sanyal, Krishnendu Chakrabarty, Mahmut Yilmaz, Hideo Fujiwara. itc 2010: 625-634 [doi]