Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine. Impact of Resistive-Bridging Defects in SRAM Core-Cell. In Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010. pages 265-269, IEEE Computer Society, 2010. [doi]
Abstract is missing.