A statistical simulation method for reliability analysis of SRAM core-cells - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine. A statistical simulation method for reliability analysis of SRAM core-cells. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 853-856, ACM, 2010. [doi]

This author has not been identified. Look up 'Renan Alves Fonseca' in GoogleThis author has not been identified. Look up 'Luigi Dilillo' in GoogleThis author has not been identified. Look up 'Alberto Bosio' in GoogleThis author has not been identified. Look up 'Patrick Girard' in GoogleThis author has not been identified. Look up 'Serge Pravossoudovitch' in GoogleThis author has not been identified. Look up 'Arnaud Virazel' in GoogleThis author has not been identified. Look up 'Nabil Badereddine' in Google

runs on WebDSL