A statistical simulation method for reliability analysis of SRAM core-cells

Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine. A statistical simulation method for reliability analysis of SRAM core-cells. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 853-856, ACM, 2010. [doi]

Abstract

Abstract is missing.