Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine. A statistical simulation method for reliability analysis of SRAM core-cells. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 853-856, ACM, 2010. [doi]
@inproceedings{FonsecaDBGPVB10-0,
title = {A statistical simulation method for reliability analysis of SRAM core-cells},
author = {Renan Alves Fonseca and Luigi Dilillo and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Nabil Badereddine},
year = {2010},
doi = {10.1145/1837274.1837487},
url = {http://doi.acm.org/10.1145/1837274.1837487},
tags = {analysis, reliability},
researchr = {https://researchr.org/publication/FonsecaDBGPVB10-0},
cites = {0},
citedby = {0},
pages = {853-856},
booktitle = {Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010},
editor = {Sachin S. Sapatnekar},
publisher = {ACM},
isbn = {978-1-4503-0002-5},
}