External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, L.-Å. Ragnarsson, Tibor Grasser, Guido Groeseneken. BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic. Microelectronics Reliability, 52(9-10):1932-1935, 2012. [doi]

Authors

Jacopo Franco

This author has not been identified. Look up 'Jacopo Franco' in Google

S. Graziano

This author has not been identified. Look up 'S. Graziano' in Google

Ben Kaczer

This author has not been identified. Look up 'Ben Kaczer' in Google

Felice Crupi

This author has not been identified. Look up 'Felice Crupi' in Google

L.-Å. Ragnarsson

This author has not been identified. Look up 'L.-Å. Ragnarsson' in Google

Tibor Grasser

This author has not been identified. Look up 'Tibor Grasser' in Google

Guido Groeseneken

This author has not been identified. Look up 'Guido Groeseneken' in Google
runs on