Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, L.-Å. Ragnarsson, Tibor Grasser, Guido Groeseneken. BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic. Microelectronics Reliability, 52(9-10):1932-1935, 2012. [doi]
Abstract is missing.