Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, L.-Å. Ragnarsson, Tibor Grasser, Guido Groeseneken. BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic. Microelectronics Reliability, 52(9-10):1932-1935, 2012. [doi]
@article{FrancoGKCRGG12,
title = {BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic},
author = {Jacopo Franco and S. Graziano and Ben Kaczer and Felice Crupi and L.-Å. Ragnarsson and Tibor Grasser and Guido Groeseneken},
year = {2012},
doi = {10.1016/j.microrel.2012.06.058},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.058},
researchr = {https://researchr.org/publication/FrancoGKCRGG12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {1932-1935},
}