Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, L.-Å. Ragnarsson, Tibor Grasser, Guido Groeseneken. BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic. Microelectronics Reliability, 52(9-10):1932-1935, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: FinFET and MOSFET preliminary comparison of gate oxide reliabilityR. Fernández, R. Rodríguez, M. Nafría, X. Aymerich, Ben Kaczer, Guido Groeseneken. mr, 46(9-11):1608-1611, 2006. [doi]
The following publications are possibly variants of this publication: