Shrikanth Ganapathy, John Kalamatianos, Keith Kasprak, Steven Raasch. On Characterizing Near-Threshold SRAM Failures in FinFET Technology. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]
Abstract is missing.