Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution - researchr publication authors

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Zhengqi Gao, Jun Tao 0001, Dian Zhou, Xuan Zeng 0001. Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3144-3148, 2020. [doi]

This author has not been identified. Look up 'Zhengqi Gao' in GoogleThis author has not been identified. Look up 'Jun Tao 0001' in GoogleThis author has not been identified. Look up 'Dian Zhou' in GoogleThis author has not been identified. Look up 'Xuan Zeng 0001' in Google

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