The following publications are possibly variants of this publication:
- Multi-Corner Parametric Yield Estimation via Bayesian Inference on Bernoulli Distribution with Conjugate PriorJiahe Shi, Zhengqi Gao, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001. iscas 2020: 1-4 [doi]
- Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian InferenceZhengqi Gao, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001, Xin Li 0001. tcad, 39(10):2029-2041, 2020. [doi]
- Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated CircuitsZhengqi Gao, Zihao Chen, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001. aspdac 2021: 892-897 [doi]
- Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental VariationNanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang 0001, Jun Tao 0001, Xuan Zeng 0001. todaes, 29(1), January 2024. [doi]