Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution - researchr publication

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Zhengqi Gao, Jun Tao 0001, Dian Zhou, Xuan Zeng 0001. Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3144-3148, 2020. [doi]

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