Zhengqi Gao, Jun Tao 0001, Dian Zhou, Xuan Zeng 0001. Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3144-3148, 2020. [doi]
@article{GaoTZZ20,
title = {Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution},
author = {Zhengqi Gao and Jun Tao 0001 and Dian Zhou and Xuan Zeng 0001},
year = {2020},
doi = {10.1109/TCAD.2019.2940682},
url = {https://doi.org/10.1109/TCAD.2019.2940682},
researchr = {https://researchr.org/publication/GaoTZZ20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {10},
pages = {3144-3148},
}