Hot carrier reliability of RF N- LDMOS for S Band radar application - researchr publication authors

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M. Gares, H. Maanane, M. Masmoudi, P. Bertram, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, Ph. Eudeline. Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectronics Reliability, 46(9-11):1806-1811, 2006. [doi]

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