M. Gares, H. Maanane, M. Masmoudi, P. Bertram, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, Ph. Eudeline. Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectronics Reliability, 46(9-11):1806-1811, 2006. [doi]
@article{GaresMMBMBMTE06,
title = {Hot carrier reliability of RF N- LDMOS for S Band radar application},
author = {M. Gares and H. Maanane and M. Masmoudi and P. Bertram and J. Marcon and M. A. Belaïd and K. Mourgues and C. Tolant and Ph. Eudeline},
year = {2006},
doi = {10.1016/j.microrel.2006.07.074},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.074},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/GaresMMBMBMTE06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1806-1811},
}