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Binary Linear ECCs Optimized for Bit Inversion in Memories with Asymmetric Error Probabilities

Valentin Gherman, Samuel Evain, Bastien Giraud. Binary Linear ECCs Optimized for Bit Inversion in Memories with Asymmetric Error Probabilities. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 298-301, IEEE, 2020. [doi]

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