Valentin Gherman, Samuel Evain, Bastien Giraud. Binary Linear ECCs Optimized for Bit Inversion in Memories with Asymmetric Error Probabilities. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 298-301, IEEE, 2020. [doi]
Abstract is missing.