Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection - researchr publication authors

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Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown. Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection. IEEE Trans. VLSI Syst., 21(9):1683-1692, 2013. [doi]

This author has not been identified. Look up 'Amlan Ghosh' in GoogleThis author has not been identified. Look up 'Rahul M. Rao' in GoogleThis author has not been identified. Look up 'Jae-Joon Kim' in GoogleThis author has not been identified. Look up 'Ching-Te Chuang' in GoogleThis author has not been identified. Look up 'Richard B. Brown' in Google

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