Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown. Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection. IEEE Trans. VLSI Syst., 21(9):1683-1692, 2013. [doi]
@article{GhoshRKCB13,
title = {Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection},
author = {Amlan Ghosh and Rahul M. Rao and Jae-Joon Kim and Ching-Te Chuang and Richard B. Brown},
year = {2013},
doi = {10.1109/TVLSI.2012.2218838},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2218838},
researchr = {https://researchr.org/publication/GhoshRKCB13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {9},
pages = {1683-1692},
}