Defect Analysis for Delay-Fault BIST in FPGAs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell. Defect Analysis for Delay-Fault BIST in FPGAs. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 124-128, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Patrick Girard' in GoogleThis author has not been identified. Look up 'Olivier Héron' in GoogleThis author has not been identified. Look up 'Serge Pravossoudovitch' in GoogleThis author has not been identified. Look up 'Michel Renovell' in Google

runs on WebDSL