Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell. Defect Analysis for Delay-Fault BIST in FPGAs. In 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece. pages 124-128, IEEE Computer Society, 2003. [doi]
@inproceedings{GirardHPR03,
title = {Defect Analysis for Delay-Fault BIST in FPGAs},
author = {Patrick Girard and Olivier Héron and Serge Pravossoudovitch and Michel Renovell},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/iolts/2003/1968/00/19680124abs.htm},
tags = {analysis},
researchr = {https://researchr.org/publication/GirardHPR03},
cites = {0},
citedby = {0},
pages = {124-128},
booktitle = {9th IEEE International On-Line Testing Symposium (IOLTS 2003), 7-9 July 2003, Kos Island, Greece},
publisher = {IEEE Computer Society},
isbn = {0-7695-1968-7},
}