Accurately Determining Bridging Defects from Layout

Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams. Accurately Determining Bridging Defects from Layout. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 87-90, IEEE Computer Society, 2007.

Abstract

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