Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability - researchr publication authors

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Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand, Kaushik Roy. Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 665-670, IEEE, 2006. [doi]

This author has not been identified. Look up 'Ashish Goel' in GoogleThis author has not been identified. Look up 'Swarup Bhunia' in GoogleThis author has not been identified. Look up 'Hamid Mahmoodi-Meimand' in GoogleThis author has not been identified. Look up 'Kaushik Roy' in Google

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