Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand, Kaushik Roy. Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 665-670, IEEE, 2006. [doi]
@inproceedings{GoelBMR06,
title = {Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability},
author = {Ashish Goel and Swarup Bhunia and Hamid Mahmoodi-Meimand and Kaushik Roy},
year = {2006},
doi = {10.1145/1118299.1118456},
url = {http://doi.acm.org/10.1145/1118299.1118456},
tags = {design},
researchr = {https://researchr.org/publication/GoelBMR06},
cites = {0},
citedby = {0},
pages = {665-670},
booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006},
editor = {Fumiyasu Hirose},
publisher = {IEEE},
isbn = {0-7803-9451-8},
}