Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand, Kaushik Roy. Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 665-670, IEEE, 2006. [doi]
Abstract is missing.