Sandeep Kumar Goel, Krishnendu Chakrabarty. Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. In Sandeep Kumar Goel, Krishnendu Chakrabarty, editors, Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. pages 161-184, CRC Press, 2014.
@incollection{GoelC14,
title = {Circuit Topology-Based Test Pattern Generation for Small-Delay Defects},
author = {Sandeep Kumar Goel and Krishnendu Chakrabarty},
year = {2014},
researchr = {https://researchr.org/publication/GoelC14},
cites = {0},
citedby = {0},
pages = {161-184},
booktitle = {Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits},
editor = {Sandeep Kumar Goel and Krishnendu Chakrabarty},
publisher = {CRC Press},
isbn = {978-1-439-82941-7},
}