Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example - researchr publication authors

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Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing. Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 371-376, IEEE, 2011. [doi]

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