Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing. Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 371-376, IEEE, 2011. [doi]
@inproceedings{HashempourDTKHBX11,
title = {Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example},
author = {Hamidreza Hashempour and Jos Dohmen and Bratislav Tasic and Bram Kruseman and Camelia Hora and Maikel van Beurden and Yizi Xing},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763065},
researchr = {https://researchr.org/publication/HashempourDTKHBX11},
cites = {0},
citedby = {0},
pages = {371-376},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}