Electric field for detecting open leads in CMOS logic circuits by supply current testing - researchr publication related

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Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. Electric field for detecting open leads in CMOS logic circuits by supply current testing. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2995-2998, IEEE, 2005. [doi]

The following publications are possibly variants of this publication:

Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric FieldHiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada. dft 2001: 287 [doi]

CMOS open defect detection by supply current testMasaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. date 2001: 509 [doi]

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