BIST-Aided Scan Test - A New Method for Test Cost Reduction - researchr publication authors

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Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama. BIST-Aided Scan Test - A New Method for Test Cost Reduction. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 359-364, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Takahisa Hiraide' in GoogleThis author has not been identified. Look up 'Kwame Osei Boateng' in GoogleThis author has not been identified. Look up 'Hideaki Konishi' in GoogleThis author has not been identified. Look up 'Koichi Itaya' in GoogleThis author has not been identified. Look up 'Michiaki Emori' in GoogleThis author has not been identified. Look up 'Hitoshi Yamanaka' in GoogleThis author has not been identified. Look up 'Takashi Mochiyama' in Google

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