Impact of within-wafer process variability on radiation response

Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou. Impact of within-wafer process variability on radiation response. Microelectronics Journal, 42(6):883-888, 2011. [doi]

Abstract

Abstract is missing.