External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Characterisation and passivation of interface defects in (1 0 0)-Si/SiO::2::/HfO::2::/TiN gate stacks

P. K. Hurley, K. Cherkaoui, S. McDonnell, G. Hughes, A. W. Groenland. Characterisation and passivation of interface defects in (1 0 0)-Si/SiO::2::/HfO::2::/TiN gate stacks. Microelectronics Reliability, 47(8):1195-1201, 2007. [doi]

Abstract

Abstract is missing.

runs on