The following publications are possibly variants of this publication:
- Test Compression Improvement with EDT Channel Sharing in SoC DesignsYu Huang, Mark Kassab, Jay Jahangiri, Janusz Rajski, Wu-Tung Cheng, Dongkwan Han, Jihye Kim, Kun Young Chung. natw 2014: 22-31 [doi]
- Test Time Reduction in EDT Bandwidth Management for SoC DesignsJakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. tcad, 32(11):1776-1786, 2013. [doi]
- Erratum to "Test Time Reduction in EDT Bandwidth Management for SoC Designs"Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. tcad, 33(1):167, 2014. [doi]